- Patent Title: Resistive random access memory and method of manufacturing the same
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Application No.: US16919047Application Date: 2020-07-01
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Publication No.: US11495637B2Publication Date: 2022-11-08
- Inventor: Po-Yen Hsu , Shih-Ning Tsai , Bo-Lun Wu , Tse-Mian Kuo
- Applicant: Winbond Electronics Corp.
- Applicant Address: TW Taichung
- Assignee: Winbond Electronics Corp.
- Current Assignee: Winbond Electronics Corp.
- Current Assignee Address: TW Taichung
- Agency: JCIPRNET
- Main IPC: H01L27/24
- IPC: H01L27/24 ; G11C7/18 ; H01L45/00

Abstract:
Provided are a resistive random access memory and a method of manufacturing the same. The resistive random access memory includes a stacked structure and a bit line structure. The stacked structure is disposed on a substrate. The stacked structure includes a bottom electrode, a top electrode and a resistance-switching layer. The bottom electrode is disposed on the substrate. The top electrode is disposed on the bottom electrode. The resistance-switching layer is disposed between the bottom electrode and the top electrode. The bit line structure covers a top surface of the stacked structure and covers a portion of a sidewall of the stacked structure. The bit line structure is electrically connected to the stacked structure.
Public/Granted literature
- US20220005868A1 RESISTIVE RANDOM ACCESS MEMORY AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2022-01-06
Information query
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