Invention Grant
- Patent Title: Distributed backscattering generator and monitor for laser performance characterization
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Application No.: US16842887Application Date: 2020-04-08
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Publication No.: US11500262B2Publication Date: 2022-11-15
- Inventor: Bo Peng , Yusheng Bian , Michal Rakowski , Tymon Barwicz
- Applicant: GLOBALFOUNDRIES U.S. Inc.
- Applicant Address: US CA Santa Clara
- Assignee: GLOBALFOUNDRIES U.S. Inc.
- Current Assignee: GLOBALFOUNDRIES U.S. Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Hoffman Warnick LLC
- Agent Yee Tze Lim
- Main IPC: G02F1/225
- IPC: G02F1/225 ; G02B6/122 ; H01S5/00 ; G02F1/21 ; H01S3/00 ; G02F1/313

Abstract:
One illustrative backscattering generator disclosed herein includes a low-reflection waveguide structure, a slot waveguide structure comprising a first waveguide, a second waveguide and a slot located between the first waveguide and the second waveguide, and a variable direction coupler operatively coupled to the low-reflection waveguide structure and the slot waveguide structure.
Public/Granted literature
- US20210318490A1 DISTRIBUTED BACKSCATTERING GENERATOR AND MONITOR FOR LASER PERFORMANCE CHARACTERIZATION Public/Granted day:2021-10-14
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