- 专利标题: Circuit configured to determine a test voltage suitable for very low voltage (VLV) testing in an integrated circuit
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申请号: US16999153申请日: 2020-08-21
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公开(公告)号: US11519960B2公开(公告)日: 2022-12-06
- 发明人: Srikanth Jagannathan , Kumar Abhishek , Gayathri Bhagavatheeswaran
- 申请人: NXP USA, Inc.
- 申请人地址: US TX Austin
- 专利权人: NXP USA, Inc.
- 当前专利权人: NXP USA, Inc.
- 当前专利权人地址: US TX Austin
- 主分类号: G01R31/3177
- IPC分类号: G01R31/3177 ; G01R31/28
摘要:
An integrated circuit device includes general purpose input/output (I/O) circuitry having a transmit level shifter circuit in a transmit I/O circuit and a receive level shifter circuit in a receive I/O circuit. The integrated circuit device also includes an I/O pad which couples an output of the transmit level shifter circuit to an input of the receive level shifter circuit, a counter circuit, an inverter circuit coupled between the receive level shifter circuit and the counter circuit, and a logic gate. The logic gate includes a first input coupled to an output of the inverter circuit, a second input coupled to a counter_done signal from the counter circuit, and an output coupled to provide a data_out signal to an input of the transmit level shifter circuit.
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