Invention Grant
- Patent Title: Manufacture modeling and monitoring
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Application No.: US15863534Application Date: 2018-01-05
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Publication No.: US11543811B2Publication Date: 2023-01-03
- Inventor: Joseph M. Kesler , Thomas D. Sharp , Uriah M. Ligget , Brian Bahr , Chris M. Hodapp , Gary E. Coyan
- Applicant: Etegent Technologies Ltd.
- Applicant Address: US OH Cincinnati
- Assignee: Etegent Technologies Ltd.
- Current Assignee: Etegent Technologies Ltd.
- Current Assignee Address: US OH Cincinnati
- Agency: Wood Herron & Evans LLP
- Main IPC: G05B19/418
- IPC: G05B19/418 ; G05B19/4063

Abstract:
Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
Public/Granted literature
- US20200218242A9 MANUFACTURE MODELING AND MONITORING Public/Granted day:2020-07-09
Information query
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