公开(公告)号：US09864366B2

公开(公告)日：2018-01-09

申请号：US14211600

申请日：2014-03-14

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Liggett ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G06F17/50 ,  G05B19/418 ,  G06Q10/06 ,  G06Q50/04 ,  B64F5/60

CPC classification number: G05B19/41875 ,  B64F5/60 ,  G05B2219/32189 ,  G06Q10/06 ,  G06Q50/04 ,  Y02P90/22 ,  Y02P90/26 ,  Y02P90/30

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20230134403A1

公开(公告)日：2023-05-04

申请号：US18068911

申请日：2022-12-20

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Liggett ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418 ,  G05B19/4063

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US11543811B2

公开(公告)日：2023-01-03

申请号：US15863534

申请日：2018-01-05

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Ligget ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418 ,  G05B19/4063

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20200218242A9

公开(公告)日：2020-07-09

申请号：US15863534

申请日：2018-01-05

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Ligget ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20140277662A1

公开(公告)日：2014-09-18

申请号：US14211600

申请日：2014-03-14

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Liggett ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G06F17/50

CPC classification number: G05B19/41875 ,  B64F5/60 ,  G05B2219/32189 ,  G06Q10/06 ,  G06Q50/04 ,  Y02P90/22 ,  Y02P90/26 ,  Y02P90/30

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

Abstract translation: 用于通过制造过程分析，监测和/或建模零件的制造的方法，装置和计算机程序产品。 从部件类型的制造部件收集的非破坏性评估数据和/或质量相关数据可以与与部件类型相关联的模拟模型对齐。 基于对齐的数据，可以监视制造过程以确定制造过程是否正常运行; 制造过程的方面可以与对准的数据在空间上相关; 和/或可以分析制造过程。