Invention Grant
- Patent Title: Automated analyzer and automated analysis system
-
Application No.: US15750526Application Date: 2016-07-25
-
Publication No.: US11549957B2Publication Date: 2023-01-10
- Inventor: Shunsuke Sasaki , Kenta Imai , Toshiharu Suzuki , Katsuhiko Sakamoto
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JPJP2015-165362 20150825
- International Application: PCT/JP2016/071665 WO 20160725
- International Announcement: WO2017/033648 WO 20170302
- Main IPC: G01N35/00
- IPC: G01N35/00 ; B01L9/00 ; G01N27/327 ; G01N33/53 ; G01N35/10 ; G01N35/04 ; G01J1/32 ; G01N21/76 ; B01L3/00

Abstract:
An automated analyzer includes an analysis operation part that causes a sample and a reagent to react and based on the reaction result performs analysis of the sample, wherein: the automated analyzer includes a plurality of units constituting the analysis operation part, a temperature adjustment mechanism that heats or cools the units, a temperature sensor that measures the temperature of the units, and a control part that controls the temperature adjustment mechanism. The control part sets the measurement startable temperature range of each unit, which is the temperature range of the operation specification thereof, and the operable temperature range, which is a temperature range that is wider than the measurement startable temperature range, and starts the analysis process of the sample when the temperature of each unit has entered the operable temperature range.
Public/Granted literature
- US20180224474A1 Automated Analyzer and Automated Analysis System Public/Granted day:2018-08-09
Information query