Invention Grant
- Patent Title: Methods for processing a semiconductor substrate
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Application No.: US17104559Application Date: 2020-11-25
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Publication No.: US11557506B2Publication Date: 2023-01-17
- Inventor: Werner Schustereder , Alexander Breymesser , Mihai Draghici , Tobias Franz Wolfgang Hoechbauer , Wolfgang Lehnert , Hans-Joachim Schulze , Marko David Swoboda
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Cooper Legal Group LLC
- Priority: DE102019132158.1 20191127
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/762 ; H01L21/768 ; H01L21/265 ; H01L21/3115 ; H01L21/78

Abstract:
Methods for processing a semiconductor substrate are proposed. An example of a method includes forming cavities in the semiconductor substrate by implanting ions through a first surface of the semiconductor substrate. The cavities define a separation layer in the semiconductor substrate. A semiconductor layer is formed on the first surface of the semiconductor substrate. Semiconductor device elements are formed in the semiconductor layer. The semiconductor substrate is separated along the separation layer into a first substrate part including the semiconductor layer and a second substrate part.
Public/Granted literature
- US20210159115A1 METHODS FOR PROCESSING A SEMICONDUCTOR SUBSTRATE Public/Granted day:2021-05-27
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