- 专利标题: Electronic device temperature test on strip film frames
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申请号: US17029988申请日: 2020-09-23
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公开(公告)号: US11573266B2公开(公告)日: 2023-02-07
- 发明人: Dale Ohmart , Marshall Worrall
- 申请人: Texas Instruments Incorporated
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Ronald O. Neerings; Frank D. Cimino
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G01R1/073 ; H01L23/34
摘要:
A system includes a platform and a contactor. The platform has a side configured to support a frame with a carrier structure and electronic devices each having first and second sides and a terminal, the first side positioned on the carrier structure, and the terminal exposed in a first portion of the second side. The contactor has first and second sides, a contact and a heater. The contact is exposed on the first side of the contactor to contact the terminal in a first portion of the second side of a selected one of the electronic devices, and the heater is exposed on the first side of the contactor to apply heat to a second portion of the second side of the selected one of the electronic devices.
公开/授权文献
- US20210199712A1 ELECTRONIC DEVICE TEMPERATURE TEST ON STRIP FILM FRAMES 公开/授权日:2021-07-01
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