Invention Grant
- Patent Title: Hybrid conductive structures
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Application No.: US16950537Application Date: 2020-11-17
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Publication No.: US11581259B2Publication Date: 2023-02-14
- Inventor: Cheng-Wei Chang , Chien-Shun Liao , Sung-Li Wang , Shuen-Shin Liang , Shu-Lan Chang , Yi-Ying Liu , Chia-Hung Chu , Hsu-Kai Chang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: H01L23/532
- IPC: H01L23/532 ; H01L23/528 ; H01L21/768

Abstract:
The present disclosure describes a method for the fabrication of ruthenium conductive structures over cobalt conductive structures. In some embodiments, the method includes forming a first opening in a dielectric layer to expose a first cobalt contact and filling the first opening with ruthenium metal to form a ruthenium contact on the first cobalt contact. The method also includes forming a second opening in the dielectric layer to expose a second cobalt contact and a gate structure and filling the second opening with tungsten to form a tungsten contact on the second cobalt contact and the gate structure. Further, the method includes forming a copper conductive structure on the ruthenium contact and the tungsten contact, where the copper from the copper conductive structure is in contact with the ruthenium metal from the ruthenium contact.
Public/Granted literature
- US20210407925A1 HYBRID CONDUCTIVE STRUCTURES Public/Granted day:2021-12-30
Information query
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