Invention Grant
- Patent Title: Quality factor estimation of an inductive element
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Application No.: US17461305Application Date: 2021-08-30
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Publication No.: US11588353B2Publication Date: 2023-02-21
- Inventor: Lionel Cimaz , Antonio Borrello , Simone Ludwig Dalla Stella
- Applicant: STMicroelectronics (Grand Ouest) SAS , STMicroelectronics S.r.l.
- Applicant Address: FR Le Mans; IT Agrate Brianza
- Assignee: STMicroelectronics (Grand Ouest) SAS,STMicroelectronics S.r.l.
- Current Assignee: STMicroelectronics (Grand Ouest) SAS,STMicroelectronics S.r.l.
- Current Assignee Address: FR Le Mans; IT Agrate Brianza
- Agency: Slater Matsil, LLP
- Priority: EP20305965 20200831
- Main IPC: H02J50/12
- IPC: H02J50/12 ; H04B5/00

Abstract:
The present disclosure relates to a device comprising an inductive element and a first capacitive element series connected between a first node and a second node, a first MOS transistor connected between the first node and a third node configured to receive a reference potential, the second node being coupled directly or via a second MOS transistor to the third node, a second capacitive element connected between a fourth node and an interconnection node between the first capacitive element and the inductive element, a current generator configured to provide an AC current to the fourth node, and a switch connected between the fourth node and the third node.
Public/Granted literature
- US20220069627A1 QUALITY FACTOR ESTIMATION OF AN INDUCTIVE ELEMENT Public/Granted day:2022-03-03
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