Invention Grant
- Patent Title: X-ray inspection device
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Application No.: US16491788Application Date: 2018-03-09
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Publication No.: US11598729B2Publication Date: 2023-03-07
- Inventor: Kazuyuki Sugimoto , Kosuke Fuchuya
- Applicant: ISHIDA CO., LTD.
- Applicant Address: JP Kyoto
- Assignee: ISHIDA CO., LTD.
- Current Assignee: ISHIDA CO., LTD.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JPJP2017-048198 20170314
- International Application: PCT/JP2018/009125 WO 20180309
- International Announcement: WO2018/168668 WO 20180920
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N33/02 ; G01N23/18

Abstract:
An X-ray inspection apparatus suppresses anomalies in inspection results caused by the X-ray inspection apparatus being used while an unsuitable setting is in effect. The X-ray inspection apparatus is provided with an inspection unit, a setting unit, a storage unit, an assessment unit, and a notification unit. The inspection unit inspects an irradiated article using detection data obtained by detecting X-rays. The setting unit sets a setting value used in inspection of the article by the inspection unit. The storage unit stores a detection value based on the detection data. The assessment unit assesses, on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable. When the assessment unit has assessed that the setting value is not suitable, the notification unit issues a notification to indicate that the setting value is not suitable.
Public/Granted literature
- US20200041423A1 X-RAY INSPECTION DEVICE Public/Granted day:2020-02-06
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