- Patent Title: Integrated circuit and method for diagnosing an integrated circuit
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Application No.: US17375450Application Date: 2021-07-14
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Publication No.: US11624779B2Publication Date: 2023-04-11
- Inventor: Etienne Auvray , Tommaso Melis , Philippe Sirito-Olivier
- Applicant: STMicroelectronics (Alps) SAS , STMicroelectronics (Grenoble 2) SAS
- Applicant Address: FR Grenoble; FR Grenoble
- Assignee: STMicroelectronics (Alps) SAS,STMicroelectronics (Grenoble 2) SAS
- Current Assignee: STMicroelectronics (Alps) SAS,STMicroelectronics (Grenoble 2) SAS
- Current Assignee Address: FR Grenoble; FR Grenoble
- Agency: Slater Matsil, LLP
- Priority: FR2007423 20200715
- Main IPC: G01R31/311
- IPC: G01R31/311 ; G01R31/28 ; G01R19/00 ; G01R15/22

Abstract:
According to one aspect, an integrated circuit includes: an electronic module configured to generate a voltage at an output, and an electronic control circuit coupled to an output of the electronic module, the electronic control circuit comprising an emissive electronic component. The electronic control circuit is configured to cause the emissive electronic component to emit light radiation as a function of a value of the voltage at the output of the electronic module relative to a value of an operating voltage of the electronic module, and the operating voltage is specific thereto during normal operation of this electronic module. The light radiation emitted by the emissive electronic component is configured to diffuse to an outer face of the integrated circuit.
Public/Granted literature
- US20220018899A1 INTEGRATED CIRCUIT AND METHOD FOR DIAGNOSING AN INTEGRATED CIRCUIT Public/Granted day:2022-01-20
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