A method and system for analyzing a physical characteristic of a film sample are described herein. The system may include a material holder system configured to hold the film sample. The system may include a tensile testing system configured to stretch the film sample and determine a physical characteristic of the film sample. The system may include a movable system coupled to the material holder system and configured to move the held film sample to be analyzed or tested between stations. The movable system is configured to move the held film sample in the material holder system to the tensile testing system.