Invention Grant
- Patent Title: Sample analysis apparatus and method
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Application No.: US17383532Application Date: 2021-07-23
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Publication No.: US11674913B2Publication Date: 2023-06-13
- Inventor: Takaomi Yokoyama , Takanori Murano
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP 2020126571 2020.07.27
- Main IPC: G01N23/2252
- IPC: G01N23/2252 ; G01N23/2209 ; G01N23/2276

Abstract:
Spectrums are measured by irradiating an electron beam on a sample while varying an accelerating potential and by detecting X-rays emitted from the sample. A normalizer unit normalizes the spectrums and thereby calculates normalized spectrums. A difference calculator unit calculates difference spectrums based on the normalized spectrums. A search unit performs a search in a database for each comparison difference spectrum, and identifies compounds contained in the sample.
Public/Granted literature
- US20220026378A1 Sample Analysis Apparatus and Method Public/Granted day:2022-01-27
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