- 专利标题: Semiconductor device and method for fabricating the same
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申请号: US17159080申请日: 2021-01-26
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公开(公告)号: US11676920B2公开(公告)日: 2023-06-13
- 发明人: Da-Jun Lin , Bin-Siang Tsai , Fu-Yu Tsai
- 申请人: UNITED MICROELECTRONICS CORP.
- 申请人地址: TW Hsin-Chu
- 专利权人: UNITED MICROELECTRONICS CORP.
- 当前专利权人: UNITED MICROELECTRONICS CORP.
- 当前专利权人地址: TW Hsin-Chu
- 代理商 Winston Hsu
- 主分类号: H01L23/00
- IPC分类号: H01L23/00
摘要:
A method for fabricating a semiconductor device includes the steps of first forming an aluminum (Al) pad on a substrate, forming a passivation layer on the substrate and an opening exposing the Al pad, forming a cobalt (Co) layer in the opening and on the Al pad, bonding a wire onto the Co layer, and then performing a thermal treatment process to form a Co—Pd alloy on the Al pad.
公开/授权文献
- US20220238468A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME 公开/授权日:2022-07-28
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