Invention Grant
- Patent Title: Ruthenium film forming method and substrate processing system
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Application No.: US16922784Application Date: 2020-07-07
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Publication No.: US11680320B2Publication Date: 2023-06-20
- Inventor: Tadahiro Ishizaka
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JP 2019129545 2019.07.11
- Main IPC: H01L21/67
- IPC: H01L21/67 ; C23C16/455 ; C23C16/06 ; H01L21/3205 ; H01L21/285

Abstract:
A ruthenium film forming method includes: causing chlorine to be adsorbed to an upper portion of a recess at a higher density than to a lower portion of the recess by supplying a chlorine-containing gas to a substrate including an insulating film and having the recess; and forming a ruthenium film in the recess by supplying a Ru-containing precursor to the recess to which the chlorine is adsorbed.
Public/Granted literature
- US20210010135A1 RUTHENIUM FILM FORMING METHOD AND SUBSTRATE PROCESSING SYSTEM Public/Granted day:2021-01-14
Information query
IPC分类: