Invention Grant
- Patent Title: Method and system for performing chemical mechanical polishing
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Application No.: US16259856Application Date: 2019-01-28
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Publication No.: US11685015B2Publication Date: 2023-06-27
- Inventor: Chih-Yuan Yang , Huai-Tei Yang , Yu-Chen Wei , Szu-Cheng Wang , Li-Hsiang Chao , Jen-Chieh Lai , Shih-Ho Lin
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- Main IPC: B24B37/32
- IPC: B24B37/32 ; B24B37/10 ; H01L21/8234 ; H01L21/304 ; H01L29/66 ; H01L29/78 ; H01L21/321

Abstract:
A method of using a polishing system includes securing a wafer in a carrier head, the carrier head including a housing enclosing the wafer, in which the housing includes a retainer ring recess and a retainer ring positioned in the retainer ring recess, the retainer ring surrounding the wafer, in which the retainer ring includes a main body portion and a bottom portion connected to the main body portion, and a bottom surface of the bottom portion includes at least one first engraved region and a first non-engraved region adjacent to the first engraved region; pressing the wafer against a polishing pad; and moving the carrier head or the polishing pad relative to the other.
Public/Granted literature
- US20200238473A1 METHOD AND SYSTEM FOR PERFORMING CHEMICAL MECHANICAL POLISHING Public/Granted day:2020-07-30
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