- 专利标题: Gate all around fin field effect transistor
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申请号: US17130960申请日: 2020-12-22
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公开(公告)号: US11688796B2公开(公告)日: 2023-06-27
- 发明人: Effendi Leobandung
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 代理机构: Tutunjian & Bitetto, P.C.
- 代理商 L. Jeffrey Kelly
- 分案原申请号: US15839122 2017.12.12
- 主分类号: H01L29/16
- IPC分类号: H01L29/16 ; H01L29/66 ; H01L29/78 ; H01L29/10 ; H01L29/161 ; H01L29/786 ; H01L29/423
摘要:
Semiconductor devices include a semiconductor fin on a substrate. The semiconductor fin has channel region and source and drain regions. A gate stack is formed all around the channel region of the semiconductor fin, such that the channel region of the semiconductor fin is separated from the substrate. An interlayer dielectric is formed around the gate stack. At least a portion of the gate stack is formed in an undercut beneath the interlayer dielectric.
公开/授权文献
- US20210151586A1 GATE ALL AROUND FIN FIELD EFFECT TRANSISTOR 公开/授权日:2021-05-20
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