Invention Grant
- Patent Title: Read voltage calibration for copyback operation
-
Application No.: US17700085Application Date: 2022-03-21
-
Publication No.: US11694763B2Publication Date: 2023-07-04
- Inventor: Kishore K. Muchherla , Niccolo' Righetti , Jeffrey S. McNeil, Jr. , Akira Goda , Todd A. Marquart , Mark A. Helm , Gil Golov , Jeremy Binfet , Carmine Miccoli , Giuseppina Puzzilli
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G11C29/42 ; G06F11/30 ; G06F11/07 ; G11C29/12

Abstract:
A system includes a memory device having a plurality of groups of memory cells and a processing device communicatively coupled to the memory device. The processing device is be configured to read a first group of memory cells of the plurality to determine a calibrated read voltage associated with the group of memory cells. The processing device is further configured to determine, using the calibrated read voltage associated with the first group of memory cells, a bit error rate (BER) of a second group of memory cells of the plurality. Prior to causing the memory device to perform a copyback operation on the plurality of groups of memory cells, the processing device is further configured to determine whether to perform a subsequent read voltage calibration on at least the second group of the plurality based, at least partially, on a comparison between the determined BER and a threshold BER.
Public/Granted literature
- US20220215895A1 READ VOLTAGE CALIBRATION FOR COPYBACK OPERATION Public/Granted day:2022-07-07
Information query