Transmission failure feedback schemes for reducing crosstalk

    公开(公告)号:US12124329B2

    公开(公告)日:2024-10-22

    申请号:US18211472

    申请日:2023-06-19

    IPC分类号: G06F11/10 G11C29/42

    摘要: Systems, apparatuses, and methods for transmission failure feedback associated with a memory device are described. A memory device may detect errors in received data and transmit an indication of the error when detected. The memory device may receive data and checksum information for the data from a controller. The memory device may generate a checksum for the received data and may detect transmission errors. The memory device may transmit an indication of detected errors to the controller, and the indication may be transmitted using a line that is different than an error detection code (EDC) line. A low-speed tracking clock signal may also be transmitted by the memory device over a line different than the EDC line. The memory device may transmit a generated checksum to the controller with a time offset applied to the checksum signaled over the EDC line.

    Modular error correction code circuitry

    公开(公告)号:US12094551B2

    公开(公告)日:2024-09-17

    申请号:US17133810

    申请日:2020-12-24

    申请人: Intel Corporation

    摘要: A modular Error Correction Code (ECC) scheme in a multi-channel IO link of an integrated circuit device is provided. The integrated circuit device may include core logic circuitry that may be configured after manufacturing. To accommodate the resulting variation, the modular ECC scheme may allow for partitioning a parity check matrix associated with the configuration of the core logic and peripheries coupled to the core logic. The parity check matrix is partitioned into smaller block matrices that is programmable. Multiple ECC modules corresponding to the block matrices are used to provide error detection and correction in the multi-channel IO link. The modular ECC scheme combined with programmable matrices (configurability) enables multi-channel IO link to be flexible to form different IO topologies.

    Memory system and method of operating the same

    公开(公告)号:US12079488B2

    公开(公告)日:2024-09-03

    申请号:US18050585

    申请日:2022-10-28

    摘要: A memory system includes a semiconductor memory device and a memory controller configured to control the semiconductor memory device. The semiconductor memory device includes a memory cell array including a plurality of memory cells configured to store data, a refresh controller configured to control a refresh operation with respect to the plurality of memory cells, and an error monitoring circuit configured to generate error information by monitoring an error in the data stored in the memory cell array based on refresh sensing data provided from the memory cell array during the refresh operation. The memory controller includes an error correction code (ECC) circuit and is further configured to correct the error in the data stored in the memory cell array using the ECC circuit based on the error information.

    TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM

    公开(公告)号:US20240290411A1

    公开(公告)日:2024-08-29

    申请号:US18597454

    申请日:2024-03-06

    摘要: Methods, systems, and devices for topology-based retirement in a memory system are described. In some examples, a memory system or memory device may be configured to evaluate error conditions relative to a physical or electrical organization of a memory array, which may support inferring the presence or absence of defects in one or more structures of a memory device. For example, based on various evaluations of detected errors, a memory system or a memory device may be able to infer a presence of a short-circuit, an open circuit, a dielectric breakdown, or other defects of a memory array that may be related to wear or degradation over time, and retire a portion of a memory array based on such an inference.

    ERROR DETECTION
    10.
    发明公开
    ERROR DETECTION 审中-公开

    公开(公告)号:US20240257893A1

    公开(公告)日:2024-08-01

    申请号:US18424922

    申请日:2024-01-29

    IPC分类号: G11C29/42

    CPC分类号: G11C29/42

    摘要: Solutions are proposed related to error detection wherein (i) each byte of a second byte sequence is determined as a function of at least one byte of a first byte sequence, (ii) a byte of the second byte sequence is impermissible if it is not equal to an assigned byte of the first byte sequence and if no error of a predefined error set corrupts this byte to the assigned byte of the first byte sequence, and (iii) at least one error is detected if the second byte sequence is impermissible, the second byte sequence being impermissible if at least one byte of the second byte sequence is impermissible.