- 专利标题: Silicon nitride x-ray window and method of manufacture for x-ray detector use
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申请号: US17411197申请日: 2021-08-25
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公开(公告)号: US11694867B2公开(公告)日: 2023-07-04
- 发明人: Joseph S. Fragala , Xing Zhao
- 申请人: Bruker Nano, Inc.
- 申请人地址: US CA Santa Barbara
- 专利权人: Bruker Nano, Inc.
- 当前专利权人: Bruker Nano, Inc.
- 当前专利权人地址: US CA Santa Barbara
- 代理机构: Boyle Fredrickson S.C.
- 主分类号: H01J5/18
- IPC分类号: H01J5/18 ; H01J9/24 ; H01J9/233 ; H01J35/18
摘要:
A method for producing a radiation window includes patterning a photo resist structure onto a double-sided silicon wafer, plasma etching the silicon wafer to create an etched silicon wafer having a silicon supporting structure etched upon a first side of the double-sided silicon wafer, applying a silicon nitride thin film to the etched silicon wafer, patterning a photo resist structure and plasma etching a second side of the double-sided silicon wafer to create an initial window in the silicon nitride thin film, and wet etching the second side of the double-sided silicon wafer to release the silicon nitride thin film and supporting structure from the portion of the double-sided silicon wafer defined by the initial window.
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