- 专利标题: Drop characteristic measurement
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申请号: US17657657申请日: 2022-04-01
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公开(公告)号: US11697284B2公开(公告)日: 2023-07-11
- 发明人: Eashwer Chandra Vidhya Sagar Kollata , Timothy Walter Dion , Tze Hwei Tseeng
- 申请人: Kateeva, Inc.
- 申请人地址: US CA Newark
- 专利权人: Kateeva, Inc.
- 当前专利权人: Kateeva, Inc.
- 当前专利权人地址: US CA Newark
- 代理机构: Hauptman Ham, LLP
- 主分类号: B41J2/045
- IPC分类号: B41J2/045 ; G02B26/08 ; G01B11/28 ; G02B27/30
摘要:
An inkjet printing system with a droplet measurement apparatus is described herein. The droplet measurement apparatus has a light source with a collimating optical system, an imaging device disposed along an optical path of the collimating optical system, and a droplet illumination zone in the optical path of the collimating optical system, the droplet illumination zone having a varying droplet illumination location, wherein the light source, the imaging device, or both are adjustable to place a focal plane of the imaging device at the droplet illumination location. The droplet measurement apparatus is structured to accommodate at least a portion of a dispenser of the printing system within the droplet illumination zone.
公开/授权文献
- US20220219448A1 DROP CHARACTERISTIC MEASUREMENT 公开/授权日:2022-07-14
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