Invention Grant
- Patent Title: Measuring device with measurement beam homogenization
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Application No.: US16200440Application Date: 2018-11-26
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Publication No.: US11703591B2Publication Date: 2023-07-18
- Inventor: Reto Stutz , Josef Lais , Jürg Hinderling
- Applicant: LEICA GEOSYSTEMS AG
- Applicant Address: CH Heerbrugg
- Assignee: LEICA GEOSYSTEMS AG
- Current Assignee: LEICA GEOSYSTEMS AG
- Current Assignee Address: CH Heerbrugg
- Agency: Maschoff Brennan
- Priority: EP 209646 2017.12.21
- Main IPC: G01S17/10
- IPC: G01S17/10 ; G01S7/481 ; G01S7/486 ; G01S7/4865 ; G01S7/4861 ; G01S7/48 ; G01C15/00 ; G02B27/00

Abstract:
An optical measuring device having a base for placing the measuring device and a targeting unit that is rotatable with respect to the base and defines a target axis for targeting a target object that is to be measured. The targeting unit has a first beam path for emitting optical measurement radiation in the direction of the target object that is to be measured. The targeting unit furthermore has a diffractive optical element (DOE), which is arranged or arrangeable in the beam path such that the optical measurement radiation is homogenized.
Public/Granted literature
- US20190196017A1 MEASURING DEVICE WITH MEASUREMENT BEAM HOMOGENIZATION Public/Granted day:2019-06-27
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