Invention Grant
- Patent Title: Apparatus and method for scalable error detection and reporting
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Application No.: US17849356Application Date: 2022-06-24
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Publication No.: US11704181B2Publication Date: 2023-07-18
- Inventor: Balaji Vembu , Bryan White , Ankur Shah , Murali Ramadoss , David Puffer , Altug Koker , Aditya Navale , Mahesh Natu
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Nicholson De Vos Webster & Elliott LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07

Abstract:
Apparatus and method for scalable error reporting. For example, one embodiment of an apparatus comprises error detection circuitry to detect an error in a component of a first tile within a tile-based hierarchy of a processing device; error classification circuitry to classify the error and record first error data based on the classification; a first tile interface to combine the first error data with second error data received from one or more other components associated with the first tile to generate first accumulated error data; and a master tile interface to combine the first accumulated error data with second accumulated error data received from at least one other tile interface to generate second accumulated error data and to provide the second accumulated error data to a host executing an application to process the second accumulated error data.
Public/Granted literature
- US20220398147A1 APPARATUS AND METHOD FOR SCALABLE ERROR DETECTION AND REPORTING Public/Granted day:2022-12-15
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