Invention Grant
- Patent Title: Through mold interconnect drill feature
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Application No.: US16550773Application Date: 2019-08-26
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Publication No.: US11705383B2Publication Date: 2023-07-18
- Inventor: Robert M. Nickerson , Rees Winters , Purushotham Kaushik Muthur Srinath
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H01L23/31
- IPC: H01L23/31 ; H01L23/48

Abstract:
Embodiments disclosed herein include electronic packages. In an embodiment, an electronic package comprises a package substrate, a first die electrically coupled to the package substrate, and a mold layer over the package substrate and around the first die. In an embodiment, the electronic package further comprises a through mold opening through the mold layer, and a through mold interconnect (TMI) in the through mold opening, wherein a center of the TMI is offset from a center of the through mold opening.
Public/Granted literature
- US20210066167A1 THROUGH MOLD INTERCONNECT DRILL FEATURE Public/Granted day:2021-03-04
Information query
IPC分类: