Memory device having sense amplifier including plural sense circuits for sensing a voltage of a bit line in a read operation
Abstract:
According to one embodiment, a memory device includes: a plurality of memory cells stacked in a first direction orthogonal to a substrate and each including a memory element having at least three resistance states and a selector coupled in parallel to the memory element; a bit line electrically coupled to the memory cells and extending in a second direction intersecting the first direction; and a sense amplifier configured to compare a voltage of the bit line with a plurality of reference voltages and sense data stored in the memory cells.
Public/Granted literature
Information query
Patent Agency Ranking
0/0