- 专利标题: Copper alloy for electronic/electrical devices, copper alloy planar bar stock for electronic/electrical devices, component for electronic/electrical devices, terminal and bus bar
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申请号: US17762630申请日: 2020-09-11
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公开(公告)号: US11725258B2公开(公告)日: 2023-08-15
- 发明人: Hirotaka Matsunaga , Yuki Ito , Hiroyuki Mori , Hiroyuki Matsukawa
- 申请人: MITSUBISHI MATERIALS CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: MITSUBISHI MATERIALS CORPORATION
- 当前专利权人: MITSUBISHI MATERIALS CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Leason Ellis LLP
- 代理商 Melvin C. Garner; Mitsuhiro Haraguchi
- 优先权: JP 19177145 2019.09.27
- 国际申请: PCT/JP2020/034423 2020.09.11
- 国际公布: WO2021/060013A 2021.04.01
- 进入国家日期: 2022-03-22
- 主分类号: C22C9/00
- IPC分类号: C22C9/00 ; B32B15/01 ; B32B15/20 ; C22F1/08
摘要:
This copper alloy for electronic or electric devices contains 100 mass ppm or greater and 400 mass ppm or less of Mg, 5 mass ppm or greater and 20 mass ppm or less of Ag, and less than 5 mass ppm of P with a balance being Cu and inevitable impurities, in which when a ratio of J3, in which all three grain boundaries constituting a grain boundary triple junction are special grain boundaries, to all grain boundary triple junctions is defined as NFJ3 and a ratio of J2, in which two grain boundaries constituting a grain boundary triple junction are special grain boundaries and one grain boundary constituting the grain boundary triple junction is a random grain boundary, to all grain boundary triple junctions is defined as NFJ2, an expression of 0.22
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