Invention Grant
- Patent Title: Electrostatic chuck and wafer etching device including the same
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Application No.: US16432281Application Date: 2019-06-05
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Publication No.: US11728198B2Publication Date: 2023-08-15
- Inventor: Myoung-Soo Park , Siqing Lu , Michio Ishikawa , Masashi Kikuchi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR 20180100575 2018.08.27
- Main IPC: H01L21/283
- IPC: H01L21/283 ; H01L21/67 ; H01L21/683

Abstract:
An electrostatic chuck according to an embodiment includes a fixing plate on which a wafer is fixed, an electrostatic plate located under the fixing plate and configured to generate an electrostatic force to fix the wafer on the fixing plate, a plurality of heating elements located under the electrostatic plate and separated to locally control a temperature of the electrostatic plate, and a cooling plate located under the plurality of separated heating elements and configured to emit heat transferred by the plurality of separated heating elements.
Public/Granted literature
- US20200066565A1 ELECTROSTATIC CHUCK AND WAFER ETCHING DEVICE INCLUDING THE SAME Public/Granted day:2020-02-27
Information query
IPC分类: