Invention Grant
- Patent Title: Reliability scan assisted voltage bin selection
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Application No.: US17744563Application Date: 2022-05-13
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Publication No.: US11733896B2Publication Date: 2023-08-22
- Inventor: Vamsi Pavan Rayaprolu , Shane Nowell , Michael Sheperek
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G11C16/04

Abstract:
A system can include a memory device and a processing device to perform operations that include performing, at a first frequency, a calibration scan, where the calibration scan includes calibrating block family-to-bin associations for one or more younger voltage bins based on first measurement data determined by the calibration scan, and calibrating block family-to-bin associations for one or more older voltage bins based on second measurement data provided by a media management scan, where the media management scan is performed at a second frequency, such that the second frequency is lower than the first frequency, each of the younger voltage bins satisfies a first age threshold criterion, and each of the older voltage bins satisfies a second age threshold criterion.
Public/Granted literature
- US20220276784A1 RELIABILITY SCAN ASSISTED VOLTAGE BIN SELECTION Public/Granted day:2022-09-01
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