- 专利标题: Structure evaluation method and structure evaluation system
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申请号: US17184134申请日: 2021-02-24
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公开(公告)号: US11754530B2公开(公告)日: 2023-09-12
- 发明人: Hidefumi Takamine , Yuki Ueda , Keisuke Ueno , Takashi Usui , Kazuo Watabe
- 申请人: KABUSHIKI KAISHA TOSHIBA
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- 优先权: JP 20155783 2020.09.16
- 主分类号: G01N29/07
- IPC分类号: G01N29/07
摘要:
According to one embodiment, a structure evaluation system includes a wave guide, a first sensor, a second sensor, and a calculation part. The wave guide is formed in a rod shape, is inserted into a hole that is formed at a predetermined depth from a surface of a measurement target, and has one end fixed to a deepest portion of the hole. The first sensor is provided at the other end of the wave guide at a position that is substantially the same as the surface. The second sensor is provided on the surface of the measurement target. The calculation part estimates a depth of damage occurring in the measurement target from the surface on the basis of a first detection value of an elastic wave transmitted to the measurement target which is detected by the first sensor through the wave guide and a second detection value obtained by an elastic wave which is detected by the second sensor.
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