Invention Grant
- Patent Title: Split-scan sense amplifier flip-flop
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Application No.: US17853409Application Date: 2022-06-29
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Publication No.: US11789075B1Publication Date: 2023-10-17
- Inventor: Nur Mohammad Baksh , Michael Q. Co , Vibhor Mittal , Kedar Karthykeyan
- Applicant: Advanced Micro Devices, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Zagorin Cave LLP
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/3185 ; G01R31/317

Abstract:
A method includes generating a functional clock signal, a scan clock signal, and a delayed clock signal based on a control clock signal and a scan enable signal. The method includes precharging or predischarging a differential pair of nodes in a first latch using the delayed clock signal and a voltage on a first power supply node and controlling a second latch using the delayed clock signal. The method includes latching data input by the first latch using the functional clock signal in a functional mode of operation and latching scan data by the first latch using the scan clock signal in a scan mode of operation.
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