Split-scan sense amplifier flip-flop
Abstract:
A method includes generating a functional clock signal, a scan clock signal, and a delayed clock signal based on a control clock signal and a scan enable signal. The method includes precharging or predischarging a differential pair of nodes in a first latch using the delayed clock signal and a voltage on a first power supply node and controlling a second latch using the delayed clock signal. The method includes latching data input by the first latch using the functional clock signal in a functional mode of operation and latching scan data by the first latch using the scan clock signal in a scan mode of operation.
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