Invention Grant
- Patent Title: Storage device for performing reliability check by using error correction code (ECC) data
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Application No.: US17467968Application Date: 2021-09-07
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Publication No.: US11798645B2Publication Date: 2023-10-24
- Inventor: Jiseok Lee , Hwangju Song , Namyong Kim , Jaeeun Yoon , Sangmu Lee , Sangwon Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR 20200188210 2020.12.30
- Main IPC: G11C29/42
- IPC: G11C29/42 ; G11C29/12 ; G11C16/34 ; G11C16/26 ; G11C16/10

Abstract:
A storage device for performing a reliability check by using error correction code (ECC) data is provided. The storage device includes a memory controller configured to detect the number of errors of second read data read out by a second read operation, based on ECC data of first read data read by a first read operation of a memory device. The memory controller includes a memory check circuit that includes a counter configured to count states of memory cells, a comparator configured to compare respective count numbers of the states with one another, and a register configured to store the number of errors based on a result of the comparison.
Public/Granted literature
- US20220208294A1 STORAGE DEVICE FOR PERFORMING RELIABILITY CHECK BY USING ERROR CORRECTION CODE (ECC) DATA Public/Granted day:2022-06-30
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