- 专利标题: Full pad coverage boundary scan
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申请号: US17217391申请日: 2021-03-30
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公开(公告)号: US11821945B2公开(公告)日: 2023-11-21
- 发明人: Prakash Narayanan , Rajesh Kumar Mittal , Rajat Mehrotra
- 申请人: TEXAS INSTRUMENTS INCORPORATED
- 申请人地址: US TX Dallas
- 专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址: US TX Dallas
- 代理商 Krista Y. Chan; Frank D. Cimino
- 分案原申请号: US15143454 2016.04.29
- 主分类号: G01R31/317
- IPC分类号: G01R31/317 ; G01R31/3185 ; G01R31/3177
摘要:
An integrated circuit, comprising functional circuitry and testing circuitry. A first set of pads is operable in a first state for communicating testing signals to the testing circuitry and operable in a second state for communicating input/output signals to the functional circuitry. A second set of pads, differing from the first set of pads, is operable in the second state for communicating testing signals to the testing circuitry for testing signals associated in the second state with the first set of pads.
公开/授权文献
- US20210215757A1 Full Pad Coverage Boundary Scan 公开/授权日:2021-07-15
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