- Patent Title: Microparticle measurement spectrometer, microparticle measurement device using the microparticle measurement spectrometer, and method for calibrating microparticle measurement photoelectric conversion system
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Application No.: US17250369Application Date: 2019-06-07
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Publication No.: US11852578B2Publication Date: 2023-12-26
- Inventor: Masaaki Hara , Tomoyuki Umetsu , Yoshiki Okamoto
- Applicant: SONY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SONY CORPORATION
- Current Assignee: SONY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: CHIP LAW GROUP
- Priority: JP 18136365 2018.07.20
- International Application: PCT/JP2019/022685 2019.06.07
- International Announcement: WO2020/017183A 2020.01.23
- Date entered country: 2021-01-12
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N3/02 ; G01N15/10 ; G01J3/02 ; G01N21/64

Abstract:
To provide a technique capable of handling quantitative data in a spectrum type microparticle measurement device without causing deterioration of the SNR. The present technology provides a microparticle measurement spectrometer including a spectroscopic element that disperses light emitted from microparticles flowing through a flow path, and a photoelectric conversion array that has a plurality of light receiving elements having different detection wavelength ranges and converts optical information obtained by the light receiving elements into electrical information, in which the photoelectric conversion array has a uniform output of all channels when light with which the amount of light per unit wavelength becomes same is incident.
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