• Patent Title: Microparticle measurement spectrometer, microparticle measurement device using the microparticle measurement spectrometer, and method for calibrating microparticle measurement photoelectric conversion system
  • Application No.: US17250369
    Application Date: 2019-06-07
  • Publication No.: US11852578B2
    Publication Date: 2023-12-26
  • Inventor: Masaaki HaraTomoyuki UmetsuYoshiki Okamoto
  • Applicant: SONY CORPORATION
  • Applicant Address: JP Tokyo
  • Assignee: SONY CORPORATION
  • Current Assignee: SONY CORPORATION
  • Current Assignee Address: JP Tokyo
  • Agency: CHIP LAW GROUP
  • Priority: JP 18136365 2018.07.20
  • International Application: PCT/JP2019/022685 2019.06.07
  • International Announcement: WO2020/017183A 2020.01.23
  • Date entered country: 2021-01-12
  • Main IPC: G01N15/14
  • IPC: G01N15/14 G01N3/02 G01N15/10 G01J3/02 G01N21/64
Microparticle measurement spectrometer, microparticle measurement device using the microparticle measurement spectrometer, and method for calibrating microparticle measurement photoelectric conversion system
Abstract:
To provide a technique capable of handling quantitative data in a spectrum type microparticle measurement device without causing deterioration of the SNR. The present technology provides a microparticle measurement spectrometer including a spectroscopic element that disperses light emitted from microparticles flowing through a flow path, and a photoelectric conversion array that has a plurality of light receiving elements having different detection wavelength ranges and converts optical information obtained by the light receiving elements into electrical information, in which the photoelectric conversion array has a uniform output of all channels when light with which the amount of light per unit wavelength becomes same is incident.
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