Invention Grant
- Patent Title: Analysis system and analysis method
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Application No.: US16480333Application Date: 2017-02-20
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Publication No.: US11860094B2Publication Date: 2024-01-02
- Inventor: Takashi Anazawa
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: MATTINGLY & MALUR, PC
- International Application: PCT/JP2017/006030 2017.02.20
- International Announcement: WO2018/150559A 2018.08.23
- Date entered country: 2019-07-24
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N27/447 ; G01N30/86 ; G01N30/88 ; C12Q1/68

Abstract:
An analysis system includes an analyzer configured to separate a sample including a plurality of components labeled with any of M kinds of fluorescent substances by chromatography and acquire first time-series data of fluorescence signals detected in N kinds (M>N) of wavelength bands in a state in which at least a part of the plurality of components is not completely separated; and a computer configured to compare the first time-series data with the second time-series data, and determine which kind of fluorescent substance of M kinds of fluorescent substances individually labels each of the plurality of components.
Public/Granted literature
- US20190383742A1 ANALYSIS SYSTEM AND ANALYSIS METHOD Public/Granted day:2019-12-19
Information query