Automatic analysis device
    1.
    发明授权

    公开(公告)号:US11965902B2

    公开(公告)日:2024-04-23

    申请号:US16644627

    申请日:2019-01-23

    CPC classification number: G01N35/02 G01N2035/00396

    Abstract: When washing the inside of a reactor vessel which is used repeatedly, a rough suction is performed before suctioning with a washing tip; however, unwanted washing liquid may remain that may affect analysis results. The present invention provides an automatic analysis device for analyzing a sample using light, in which the automatic analysis device is characterized in that: a washing mechanism comprises a washing liquid supply nozzle that supplies washing liquid to a reactor vessel after analysis, a washing liquid suction nozzle that suctions the supplied washing liquid, a washing tip provided to the bottom end of the washing liquid suction nozzle, and a rough suction nozzle that suctions, in advance, a liquid within the reactor vessel before suctioning with the washing tip; and after the rough suction, liquid is caused to remain so that the bottom surface of the reactor vessel is not exposed.

    Automatic analyzer
    3.
    发明授权

    公开(公告)号:US11719714B2

    公开(公告)日:2023-08-08

    申请号:US16645583

    申请日:2019-03-19

    Abstract: The automatic analyzer includes: a liquid dispensing mechanism that performs suction of a liquid; a pressure sensor that measures a change of an internal pressure of a probe provided at the liquid dispensing mechanism; a determination section that determines whether the suction of the liquid by the probe is normal suction or air suction abnormality; an analysis section; a storage section that stores a cumulative number of times of air suction abnormality per liquid and an allowable cumulative number for the cumulative number of times of air suction abnormality; and a controller that exercises operation control over the liquid dispensing mechanism, the determination section, and the analysis section. The controller exercises control such that the cumulative number of times of air suction abnormality is updated and the updated cumulative number is stored in the storage section even if the air suction abnormality occurs non-consecutively.

    Vacuum processing apparatus
    4.
    发明授权

    公开(公告)号:US11710619B2

    公开(公告)日:2023-07-25

    申请号:US14468397

    申请日:2014-08-26

    Abstract: A vacuum processing apparatus that can excellently perform uniform processing and can efficiently perform regular maintenance and occasional maintenance even in the case where the diameter of a workpiece is increased. A vacuum processing apparatus having a vacuum transport chamber includes: a lower container in a cylindrical shape; a sample stage unit including a sample stage and a ring-shaped sample stage base having a support beam disposed in axial symmetry with respect to the center axis of the sample stage; an upper container in a cylindrical shape; and a moving unit that is fixed to the sample stage base and moves the sample stage unit in the vertical direction and in the horizontal direction.

    Automatic analyzer
    6.
    发明授权

    公开(公告)号:US11525837B2

    公开(公告)日:2022-12-13

    申请号:US16637808

    申请日:2018-07-26

    Abstract: An object is to provide an automatic analyzer that prevents an effect of various environmental changes on an equilibrium state of an immunological binding reaction. An automatic analyzer of an embodiment of the invention includes a B/F separation unit that executes a B/F separation step separating an unreacted component and a reacted component from a liquid in which a sample and a reagent are reacted, a detection unit that detects a reacted component in the liquid after the B/F separation step, and a temperature maintaining unit that maintains the B/F separation unit and the detection unit in substantially the same temperature environment.

    Charged particle beam apparatus
    10.
    发明授权

    公开(公告)号:US11430630B2

    公开(公告)日:2022-08-30

    申请号:US16641035

    申请日:2017-09-04

    Abstract: The present invention realizes a composite charged particle beam apparatus capable of suppressing a leakage magnetic field from a pole piece forming an objective lens of an SEM with a simple structure. The charged particle beam apparatus according to the present invention obtains an ion beam observation image while passing a current to a first coil constituting the objective lens, and performs an operation of reducing the image shift by passing a current to a second coil with a plurality of current values, and determines a current to be passed to the second coil based on a difference between the operations.

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