Invention Grant
- Patent Title: Semiconductor device having increased contact area between a source/drain pattern and an active contact
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Application No.: US17686700Application Date: 2022-03-04
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Publication No.: US11862679B2Publication Date: 2024-01-02
- Inventor: Min-Hee Choi , Seokhoon Kim , Choeun Lee , Edward Namkyu Cho , Seung Hun Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR 20180082280 2018.07.16
- Main IPC: H01L27/092
- IPC: H01L27/092 ; H01L29/78 ; H01L21/8238 ; H10B12/00 ; H01L29/08 ; H01L29/417 ; H10B10/00

Abstract:
A semiconductor device including a substrate including an active pattern; a gate electrode crossing the active pattern; a source/drain pattern adjacent to one side of the gate electrode and on an upper portion of the active pattern; an active contact electrically connected to the source/drain pattern; and a silicide layer between the source/drain pattern and the active contact, the source/drain pattern including a body part including a plurality of semiconductor patterns; and a capping pattern on the body part, the body part has a first facet, a second facet on the first facet, and a corner edge defined where the first facet meets the second facet, the corner edge extending parallel to the substrate, the capping pattern covers the second facet of the body part and exposes the corner edge, and the silicide layer covers a top surface of the body part and a top surface of the capping pattern.
Public/Granted literature
- US20220190112A1 SEMICONDUCTOR DEVICE Public/Granted day:2022-06-16
Information query
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