Invention Grant
- Patent Title: Method for fabricating semiconductor device
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Application No.: US17737393Application Date: 2022-05-05
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Publication No.: US11864370B2Publication Date: 2024-01-02
- Inventor: Kang Yoo Song , Mi Na Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T GROUP LLP
- Priority: KR 20210135757 2021.10.13
- Main IPC: H10B12/00
- IPC: H10B12/00 ; H01L21/28 ; H01L49/02

Abstract:
Present invention relates to a method of fabricating a semiconductor device that can facilitate the processes of etching a supporter and removing a mold layer. According to the present invention, a method of fabricating a semiconductor device semiconductor device comprises: sequentially forming a substructure over a substrate and a etch stop layer over the substructure; forming a stack structure of alternately stacked mold layers and supporter layers over the etch stop layer; forming a plurality of supporter holes in the stack structure exposing the etch stop layer; forming a sacrificial layer filling each of the plurality of the supporter holes; forming a plurality of lower electrode openings exposing the substructure by etching the sacrificial layer and the stack structure; and forming a lower electrode inside the plurality of lower electrode openings.
Public/Granted literature
- US20230110314A1 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE Public/Granted day:2023-04-13
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