• 专利标题: Single-crystal X-ray structure analysis apparatus and method, and sample holder and applicator therefor
  • 申请号: US17295858
    申请日: 2019-11-21
  • 公开(公告)号: US11874238B2
    公开(公告)日: 2024-01-16
  • 发明人: Takashi Sato
  • 申请人: Rigaku Corporation
  • 申请人地址: JP Tokyo
  • 专利权人: Rigaku Corporation
  • 当前专利权人: Rigaku Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: ASLAN LAW, P.C.
  • 优先权: JP 18218732 2018.11.22
  • 国际申请: PCT/JP2019/045690 2019.11.21
  • 国际公布: WO2020/105721A 2020.05.28
  • 进入国家日期: 2021-05-20
  • 主分类号: G01N23/207
  • IPC分类号: G01N23/207 G01N23/20025
Single-crystal X-ray structure analysis apparatus and method, and sample holder and applicator therefor
摘要:
User-friendly single-crystal X-ray structure analysis apparatus and method for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and enabling the analysis including management of related information, and a sample holder and an applicator therefor are provided. There are provided a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material is provided, the apparatus comprising a sample holder that comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein and that holds the sample; a goniometer that rotationally moves with the sample holder 250 being attached; and an information acquisition section 600 that acquires information about the porous complex crystal.
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