Single-crystal X-ray structure analysis apparatus and method, and sample holder and applicator therefor

    公开(公告)号:US11874238B2

    公开(公告)日:2024-01-16

    申请号:US17295858

    申请日:2019-11-21

    Inventor: Takashi Sato

    CPC classification number: G01N23/2076 G01N23/20025 G01N2223/1016

    Abstract: User-friendly single-crystal X-ray structure analysis apparatus and method for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and enabling the analysis including management of related information, and a sample holder and an applicator therefor are provided. There are provided a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material is provided, the apparatus comprising a sample holder that comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein and that holds the sample; a goniometer that rotationally moves with the sample holder 250 being attached; and an information acquisition section 600 that acquires information about the porous complex crystal.

    Single-crystal X-ray structure analysis apparatus, and method therefor

    公开(公告)号:US11874204B2

    公开(公告)日:2024-01-16

    申请号:US17295859

    申请日:2019-11-21

    Inventor: Takashi Sato

    CPC classification number: G01N23/207 G01N1/28 G01N23/20025

    Abstract: A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.

    Single-crystal x-ray structure analysis apparatus and method, and sample holder unit therefor

    公开(公告)号:US11802844B2

    公开(公告)日:2023-10-31

    申请号:US17295855

    申请日:2019-11-21

    Inventor: Takashi Sato

    CPC classification number: G01N23/20025 G01N1/28 G01N23/207 G01N23/20016

    Abstract: A single-crystal X-ray structure analysis apparatus capable of surely and easily performing a single-crystal X-ray structure analysis using a crystalline sponge, and an analysis method and a sample holder unit thereof are provided. There are provided a sample holder that holds a sample; a goniometer that rotationally moves, the sample holder 250 being attached to the goniometer; an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder 250 attached to the goniometer, wherein the sample holder 250 comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein, and the applicator comprises a space for soaking the sample in the porous complex crystal of the sample holder 250.

    Soaking machine and soaking method of sample for single-crystal X-ray structure analysis

    公开(公告)号:US11774379B2

    公开(公告)日:2023-10-03

    申请号:US17295862

    申请日:2019-11-21

    Inventor: Takashi Sato

    CPC classification number: G01N23/20033 G01N1/28 G01N23/20025 G01N23/207

    Abstract: It is made possible to surely supply a porous complex crystal in which a sample is soaked, into a single-crystal X-ray structure analysis apparatus. There is provided a soaking machine for soaking a sample, comprising a supply section that supplies the sample to the porous complex crystal held by a sample holder 310, a temperature control section that controls a temperature of the porous complex crystal, a drive section that drives the supply section, and a control section that controls the supply section, the temperature control section and the drive section. The supply section supplies the sample to the porous complex crystal held by the sample holder 310 inside the applicator 311; and the temperature control section controls the temperature of the porous complex crystal held by the sample holder 310, inside the applicator 311 into which the sample is supplied.

    Single-crystal X-ray structure analysis apparatus, and method therefor

    公开(公告)号:US12105034B2

    公开(公告)日:2024-10-01

    申请号:US18448939

    申请日:2023-08-13

    Inventor: Takashi Sato

    CPC classification number: G01N23/207 G01N1/28 G01N23/20025

    Abstract: A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.

    Single-crystal X-ray structure analysis apparatus and method, and sample holder unit therefor

    公开(公告)号:US12092593B2

    公开(公告)日:2024-09-17

    申请号:US18365263

    申请日:2023-08-04

    Inventor: Takashi Sato

    CPC classification number: G01N23/20025 G01N1/28 G01N23/20016 G01N23/207

    Abstract: A sample holder unit used for a single-crystal X-ray structure analysis apparatus, the sample holder unit comprising a sample holder for being attached to a goniometer in the single-crystal X-ray structure analysis apparatus, and an applicator that stores the sample holder, wherein the sample holder comprises a holding part that holds a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein, and the applicator comprises a space for soaking the sample in the porous complex crystal of the sample holder, wherein the applicator comprises a space for soaking the sample in the porous complex crystal of the sample holder, wherein the porous complex crystal is soaked only in a preserving solvent in the space.

    Soaking machine of single-crystal X-ray structure analysis sample, and soaking method therefor

    公开(公告)号:US12055501B2

    公开(公告)日:2024-08-06

    申请号:US17295860

    申请日:2019-11-21

    Inventor: Takashi Sato

    CPC classification number: G01N23/2055 G01N1/28 G01N23/20025 G01N23/207

    Abstract: A soaking machine of a single-crystal X-ray structure analysis sample, that makes it possible to surely perform soaking by supplying a sample into a porous complex crystal; and a soaking method therefor, are provided. There is provided is a soaking machine 300 for soaking a sample, comprising a supply section that supplies the sample into an applicator 311 in which a sample holder 310 that holds a porous complex crystal is inserted, a temperature adjustment section 320 that controls a temperature of the applicator 311, a discharge section that carries out the sample from the inside of the applicator 311 in which the sample holder 310 is inserted, and a control section 340 that controls the supply section, the temperature adjustment section 320 and the discharge section.

    Sample holder unit for single-crystal X-ray structure analysis apparatus

    公开(公告)号:US11921060B2

    公开(公告)日:2024-03-05

    申请号:US17295865

    申请日:2019-11-21

    Inventor: Takashi Sato

    CPC classification number: G01N23/20025 G01N23/205 G01N23/207

    Abstract: A sample holder unit for a single-crystal X-ray structure analysis apparatus that quickly, surely and easily performs structure analysis with a crystalline sponge, the structure analysis inclusive of an operation of attaching a sample soaked in the crystalline sponge thereto, even if having no specialized knowledge, is provided. There are provided a sample holder, and an applicator comprising an opening 302 and a storing space in which the sample holder is stored, and a pull-out prevention part that selectively prevents and releases the sample holder stored in the storing space from being pulled out from the opening 302, wherein the pull-out prevention part comprises an operation part that releases pull-out prevention thereof in a state where the sample holder stored in the applicator is attached to the goniometer.

    Single-crystal X-ray structure analysis system

    公开(公告)号:US11879857B2

    公开(公告)日:2024-01-23

    申请号:US17295856

    申请日:2019-11-21

    Inventor: Takashi Sato

    CPC classification number: G01N23/2076 G01N2223/307 G01N2223/604

    Abstract: A single-crystal X-ray structure analysis system capable of surely and easily performing a precise step of soaking a very small amount of a sample in a framework of a fine crystalline sponge, is provided. There are provided a soaking apparatus 500 and a single-crystal X-ray structure analysis apparatus, the single-crystal X-ray structure analysis apparatus comprising a sample holder that holds a sample, the sample holder comprising a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the goniometer to which the sample holder is attached; an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; wherein the soaking apparatus 500 soaks the sample in the porous complex crystal of the sample holder.

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