Invention Grant
- Patent Title: Method of washing an aspiration probe of an in-vitro diagnostic system, in-vitro diagnostic method, and in-vitro diagnostic system
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Application No.: US17507874Application Date: 2021-10-22
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Publication No.: US11879904B2Publication Date: 2024-01-23
- Inventor: Kouhei Nonaka , Takamichi Mori , Yoichi Aruga , Yosuke Horie , Andrew McCaughey , Alexander Seiler
- Applicant: Roche Diagnostics Operations, Inc. , Hitachi High-Technologies Corporation
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diagnostics Operations, Inc.,Hitachi High-Technologies Corporation
- Current Assignee: Roche Diagnostics Operations, Inc.,Hitachi High-Technologies Corporation
- Current Assignee Address: US IN Indianapolis; JP Tokyo
- Agency: Woodard, Emhardt, Henry, Reeves & Wagner, LLP
- The original application number of the division: US16434698 2019.06.07
- Main IPC: G01N35/10
- IPC: G01N35/10 ; B01L3/02 ; G01N35/00 ; B01F31/00

Abstract:
A method of washing an aspiration probe of an in-vitro diagnostic system is disclosed. The aspiration probe comprises an outer surface and an inner surface forming an inner space for receiving a fluid. The method comprises dipping the aspiration probe into a first wash fluid so that the outer surface is immersed at least in part into the first wash fluid, aspirating an amount of the first wash fluid into the inner space of the aspiration probe, propagating an ultrasonic vibration to the outer surface of the aspiration probe via the first wash fluid, and rinsing the outer surface and the inner surface of the aspiration probe with a second wash fluid. Further, an in-vitro diagnostic method and an in-vitro diagnostic system are disclosed.
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