Invention Grant
- Patent Title: Coplanar bump contacts of differing sizes
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Application No.: US17403752Application Date: 2021-08-16
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Publication No.: US11887958B2Publication Date: 2024-01-30
- Inventor: Cheng-Yang Su
- Applicant: STMICROELECTRONICS LTD
- Applicant Address: HK Kowloon
- Assignee: STMICROELECTRONICS LTD
- Current Assignee: STMICROELECTRONICS LTD
- Current Assignee Address: HK Kowloon
- Agency: Seed IP Law Group LLP
- Main IPC: H01L23/00
- IPC: H01L23/00

Abstract:
A die including a first contact with a first shape (e.g., ring-shaped) and a second contact with a second shape (e.g., cylindrical shaped) different from the first shape. The first contact has an opening that extends through a central region of a surface of the first contact. A first solder portion is coupled to the surface of the first contact and the first solder portion has the first shape. A second solder portion is coupled to a surface of the second contact and the second solder portion has the second shape. The first solder portion and the second solder portion both have respective points furthest away from a substrate of the die. These respective points of the first solder portion and the second solder portion are co-planar with each other such that a standoff height of the die remains consistent when coupled to a PCB or an electronic component.
Public/Granted literature
- US20220059486A1 COPLANAR BUMP CONTACTS OF DIFFERING SIZES Public/Granted day:2022-02-24
Information query
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