- Patent Title: In-line monitoring of OLED layer thickness and dopant concentration
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Application No.: US17152689Application Date: 2021-01-19
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Publication No.: US11889740B2Publication Date: 2024-01-30
- Inventor: Yeishin Tung , Byung Sung Kwak , Robert Jan Visser , Gangadhar Banappanavar , Dinesh Kabra
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Fish & Richardson P.C.
- Main IPC: H01L51/56
- IPC: H01L51/56 ; B05D1/00 ; H10K71/00

Abstract:
An organic light-emitting diode (OLED) deposition system includes two deposition chambers, a transfer chamber between the two deposition chambers, a metrology system having one or more sensors to perform measurements of the workpiece within the transfer chamber, and a control system to cause the system to form an organic light-emitting diode layer stack on the workpiece. Vacuum is maintained around the workpiece while the workpiece is transferred between the two deposition chambers and while retaining the workpiece within the transfer chamber. The control system is configured to cause the two deposition chambers to deposit two layers of organic material onto the workpiece, and to receive a first plurality of measurements of the workpiece in the transfer chamber from the metrology system.
Public/Granted literature
- US20210226183A1 IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION Public/Granted day:2021-07-22
Information query
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