Invention Grant
- Patent Title: Method to fix cumulative read induced drain side select gate downshift in memory apparatus with on-pitch drain side select gate
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Application No.: US17551640Application Date: 2021-12-15
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Publication No.: US11894067B2Publication Date: 2024-02-06
- Inventor: Xiang Yang , Abhijith Prakash , Shubhajit Mukherjee
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Addison
- Agency: Dickinson Wright PLLC
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G11C16/26 ; G11C16/04 ; G11C16/34 ; G11C16/32 ; G11C16/16

Abstract:
A memory apparatus and method of operation are provided. The memory apparatus includes memory cells configured to retain a threshold voltage. The memory cells are connected to one of a plurality of word lines and are arranged in strings comprising a plurality of blocks. A control means is coupled to the plurality of word lines and the strings and is configured to periodically determine a read frequency metric associated with a plurality of read operations of one of the plurality of blocks of the memory cells. The control means is also configured to relocate data of the one of the plurality of blocks and cause the one of the plurality of blocks to remain unused for a predetermined relaxation time based on the read frequency metric.
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