- 专利标题: Semiconductor device and method for fabricating the same
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申请号: US17509061申请日: 2021-10-24
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公开(公告)号: US11948975B2公开(公告)日: 2024-04-02
- 发明人: Chih-Kai Hsu , Ssu-I Fu , Yu-Hsiang Hung , Wei-Chi Cheng , Jyh-Shyang Jenq
- 申请人: UNITED MICROELECTRONICS CORP.
- 申请人地址: TW Hsin-Chu
- 专利权人: UNITED MICROELECTRONICS CORP.
- 当前专利权人: UNITED MICROELECTRONICS CORP.
- 当前专利权人地址: TW Hsin-Chu
- 代理商 Winston Hsu
- 优先权: TW 5125383 2016.08.10
- 分案原申请号: US16703780 2019.12.04
- 主分类号: H01L29/08
- IPC分类号: H01L29/08 ; H01L21/8238 ; H01L27/092 ; H01L29/423 ; H01L29/66 ; H01L29/78
摘要:
A method for fabricating semiconductor device includes the steps of: forming a gate structure on a substrate; forming a spacer around the gate structure; and forming a buffer layer adjacent to the gate structure. Preferably, the buffer layer includes a crescent moon shape and the buffer layer includes an inner curve, an outer curve, and a planar surface connecting the inner curve and an outer curve along a top surface of the substrate, in which the planar surface directly contacts the outer curve on an outer sidewall of the spacer.
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