发明授权
- 专利标题: Substrate processing apparatus and method of manufacturing semiconductor device
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申请号: US18077607申请日: 2022-12-08
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公开(公告)号: US11952664B2公开(公告)日: 2024-04-09
- 发明人: Hidenari Yoshida , Takeo Hanashima , Hiroaki Hiramatsu
- 申请人: Kokusai Electric Corporation
- 申请人地址: JP Tokyo
- 专利权人: KOKUSAI ELECTRIC CORPORATION
- 当前专利权人: KOKUSAI ELECTRIC CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Volpe Koenig
- 主分类号: C23C16/455
- IPC分类号: C23C16/455 ; C23C16/40 ; C23C16/44 ; C23C16/52 ; H01L21/02 ; H01L21/67
摘要:
Described herein is a technique capable of improving the uniformity of the film formation among the substrates. According to the technique described herein, there is provided a configuration including: a reaction tube having a process chamber where a plurality of substrates are processed; a buffer chamber protruding outward from the reaction tube and configured to supply a process gas to the process chamber, the buffer chamber including: a first nozzle chamber where a first nozzle is provided; and a second nozzle chamber where a second nozzle is provided; an opening portion provided at a lower end of an inner wall of the reaction tube facing the buffer chamber; and a shielding portion provided at a communicating portion of the opening portion between the second nozzle chamber and the process chamber.
信息查询
IPC分类: