发明授权
- 专利标题: Using split word lines and switches for reducing capacitive loading on a memory system
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申请号: US17868982申请日: 2022-07-20
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公开(公告)号: US12002499B2公开(公告)日: 2024-06-04
- 发明人: Sheng-chen Wang , Meng-Han Lin , Chia-En Huang , Yi-Ching Liu
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: FOLEY & LARDNER LLP
- 主分类号: G11C11/22
- IPC分类号: G11C11/22 ; H01L23/528 ; H10B51/20 ; H10B51/30
摘要:
Systems and methods disclosed herein are related to a memory system. In one aspect, the memory system includes a first set of memory cells including a first string of memory cells and a second string of memory cells; and a first switch including: a first electrode connected to first electrodes of the first string of memory cells and first electrodes of the second string of memory cells, and a second electrode connected to a first global bit line, wherein gate electrodes of the first string of memory cells are connected to a first word line and gate electrodes of the second string of memory cells are connected to a second word line.
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