发明授权
- 专利标题: Real-time detection of particulate matter during deposition chamber manufacturing
-
申请号: US16946348申请日: 2020-06-17
-
公开(公告)号: US12002665B2公开(公告)日: 2024-06-04
- 发明人: Mehdi Vaez-Iravani , Todd J. Egan , Kyle Ross Tantiwong
- 申请人: Applied Materials, Inc.
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Lowenstein Sandler LLP
- 主分类号: H01J37/32
- IPC分类号: H01J37/32 ; C23C14/34 ; C23C14/54 ; C23C16/44 ; C23C16/52 ; G01N21/01 ; H01J37/34
摘要:
Implementations disclosed describe a system that includes a deposition chamber, a light source to produce an incident beam of light, wherein the incident beam of light is to illuminate a region of the deposition chamber, and a camera to collect a scattered light originating from the illuminated region of the deposition chamber, wherein the scattered light is to be produced upon interaction of the first incident beam of light with particles inside the illuminated region of the deposition chamber. The described system may optionally have a processing device, coupled to the camera, to generate scattering data for a plurality of locations of the illuminated region, wherein the scattering data for each location comprises intensity of the scattered light originating from this location.
公开/授权文献
信息查询