- 专利标题： Flow rate abnormality detection device, cooling system, flow rate abnormality detection method and program
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申请号： US16491209申请日： 2018-03-02
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公开(公告)号： US12007182B2公开(公告)日： 2024-06-11
- 发明人: Yasuhito Nakamura
- 申请人： NEC Platforms, Ltd.
- 申请人地址： JP Kawasaki
- 专利权人： NEC Platforms, Ltd.
- 当前专利权人： NEC Platforms, Ltd.
- 当前专利权人地址： JP Kanagawa
- 优先权： JP 17041556 2017.03.06
- 国际申请： PCT/JP2018/008090 2018.03.02
- 国际公布： WO2018/164004A 2018.09.13
- 进入国家日期： 2019-09-05
- 主分类号： F28F27/00
- IPC分类号： F28F27/00 ; G06F1/20 ; H05K7/20 ; G01F1/00
摘要：
A flow rate abnormality detection device includes: a number determination unit that determines a number of devices to be cooled; a threshold value setting unit that sets a threshold value based on the number of devices to be cooled; and an abnormality determination unit that determines that there is an abnormality when a total flow rate of refrigerant supplied to the devices to be cooled is less than the threshold value.
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