Invention Grant
- Patent Title: Semiconductor device and method of fabricating same
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Application No.: US18137733Application Date: 2023-04-21
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Publication No.: US12009299B2Publication Date: 2024-06-11
- Inventor: In-Hyuk Choi , Wonchul Lee , Joonhyoung Yang
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Fish & Richardson P.C.
- Priority: KR 20210020108 2021.02.15
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L23/522 ; H01L23/528 ; H01L29/06

Abstract:
A semiconductor device includes; a semiconductor substrate including a first region and a second region, a first interlayer insulating layer on the second region, a capping layer disposed on the first interlayer insulating layer, an upper surface of the capping layer includes a first trench, conductive patterns spaced apart on the capping layer, side surfaces of the conductive patterns are aligned with inner side surfaces of the first trench, and a peripheral separation pattern disposed in the first trench to cover the side surfaces of the conductive patterns. The peripheral separation pattern has a first thickness on the side surfaces of the conductive patterns and a second thickness greater than or equal to the first thickness on a lower surface.
Public/Granted literature
- US20230260904A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING SAME Public/Granted day:2023-08-17
Information query
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